The dependence of the intensity patterns as they are scattered by small objects, is exploited in metrology applications where very small sizes need to be accurately measured or monitored. Search online for specific applications of interferometry in metrology. In your lab report specify at least 1 application of interferometry for metrology.
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Physics, 22.06.2019 15:00, banna01man
Greg drew a diagram to compare two of the fundamental forces. which labels belong in the areas marked x, y and z? gravitational force electromagnetic force x. attractive y repulsive z: infinite range x: infinite range y attractive z. repulsive x. always attractive y: infinite range z: attractive or repulsive x. attractive or repulsive y infinite range z: always attractive
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Physics, 22.06.2019 16:20, punkieladie
What organization and environment is described above?
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The dependence of the intensity patterns as they are scattered by small objects, is exploited in met...
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