Data on oxide thickness of semiconductors are as follows: 425 431 416 419 422 436 420 410 429 430 424 426 408 433 435 431 410 426 411 438 422 428 414 416 Consider this data as a sample of the population. (a) Calculate a point estimate of the mean oxide thickness for all wafers in the population. (Round your answer to 3 decimal places.) (b) Calculate a point estimate of the standard deviation of oxide thickness for all wafers in the population. (Round your answer to 2 decimal places.) (c) Calculate the standard error of the point estimate from part (a). (Round your answer to 2 decimal places.) (d) Calculate a point estimate of the median oxide thickness for all wafers in the population. (Express your answer to 1 decimal places.) (e) Calculate a point estimate of the proportion of wafers in the population that have oxide thickness greater than 430 angstrom. (Round your answer to 4 decima